Academic Courses

Academic Microscopy Courses in Israel
  • The following list is partial and is being updated constantly. All suggestions and/or additions are always welcomed.

Ben-Gurion University of the Negev:
  Course Title:                      ''Introduction to Electron Microscopy for Natural Sciences''
Lecturer: Dr. Maya Bar Sadan \ Department of Chemistry
Syllabus: The course focuses on various electron microscopy techniques. The course is intended for students from the Natural Sciences Faculty lacking previous knowledge of electron microscopy. The course may also serve as the theoretical background required for the practical courses. The goal is to introduce the operation and function of electron microscopes, the different information offered by each of them and their possible contribution for research.

  1. Introduction to Solid state
  2. Diffraction
  3. Electron Microscopy
    1. Transmission electron microscopy: Introduction and principles
      1. Electron sources and electron guns
      2. Electromagnetic lenses
      3. Resolution and limiting factors
      4. Imaging and contrast formation mechanisms
      5. The contrast transfer function
      6. Sample preparation, Vacuum systems, CCD cameras
    2. Scanning transmission electron microscopy (STEM)
    3. Analysis (STEM/TEM) – DF/BF
    4. Scanning electron microscope (SEM)
  4. Advanced topics.
  Course Title:                      ''Introduction to Electron Microscopy''
Lecturer: Dr. Louisa Meshi \ Department of Materials Engieering
Syllabus: the module intends to provide basic knowledge on electron microscopy as a science and as a technique. Upon successful completion of the module – the students will understand transmission and scanning electron microscope components, use and sample preparation. One of the major goals is that student will be able to choose an appopreate technique (among electron microscopy techniques taught) for solution of materials engineering problems and know how to prepare a sample and interpret the results.
Learning outcomes of the module: On successful completion of the course, the student should be able to:

  1. define advantages and disadvantages of transmission electron microscopy (TEM) and scanning electron microscopy (SEM) methods;
  2. list known artifacts which appear due to unappropriate sample preparation;
  3. choose appropriate SEM/TEM sample preparation technique;
  4. summarise principles of SEM, TEM and scanning –transmission (STEM) set-ups: vacuum system, detectors, scanning coils, electro-magnetic lenses, apertures, stages/holders and electron guns;
  5. define terms such as resolution of these microscopes, magnification, depth of field and depth of focus and relate influence of various factors on these terms;
  6. conlude contrast mechanisms in studied electron microscopes;
  7. describe special techniques such as HRTEM, HRSEM, cryo TEM and ESEM;
  8. differentiate among different electorn diffraction methods;
  9. index polycrystalline and single crystalline electron diffraction patterns;
  10. explain EDS and WDS methods, choose appropriate one for solution of analytical problems in material science
Remarks: The course is given on fall semesters.
  Course Title:                      ''Advanced Methods for Characterization of Structural Defects''
Lecturer: Dr. Louisa Meshi \ Department of Materials Engieering
Syllabus: the module provides tools and knowledge for successful characterization of structural defects using traditional and novel techniques of electron microscopy and X-ray diffraction. The major aim of the course to deepen the knowledge of the two methods mentioned above and to be able to choose the appropriate technique for defect characterization.
Learning outcomes of the module: On successful completion of the course, the student should be able to:
1. define advantages and disadvantages of transmission electron microscopy (TEM) and X-ray diffraction methods;
2. characterize the structure and identify phases;
3. define influence of structural defects on X-ray diffractogram;
4. calculate and identify the defects using X-ray diffraction;
5. identify the course for X-ray diffraction peak broadening;
6. define and understand the methods for 3D defect chartacterization by TEM (defects such as stacking faults, precipitates, twin and other boundaries);
7. define and understand the methods for 2D defect chartacterization by TEM (defects such as dislocations);
8. construct superimposed stereographic projection for analysis of precipitate/matrix orientation relationship
Remarks: The course is given on fall semesters.
  Course Title:                      ''Introduction to Microscopy – Basic Principles and Cryo Applications''
Lecturer: Prof. Oren Regev \ Department of Chemical Engineering
Syllabus: The student will be familiar with few electron microscopy techniques, focusing on cryo-TEM. During the course there will be lecture sessions, which will include theoretical aspects of microscopy. Demonstrations of the techniques/equipment and hands-on personal experience will be given as well.
The course is aimed at introducing the techniques and explore the possibilities in microscopy. Nevertheless, in order to operate such sophisticated equipment one will need additional long technical training period.

Introduction to Transmission Electron Microscopy (TEM)
Electron Guns

Scattering – Elastic and inelastic
Contrast transfer function
Resolution contrast and magnification

Image formation – contrast mechanisms
Electron crystallography (Ext.)
Tomography (Ext.)
Analytical methods (Ext.)
Cryogenic TEM techniques
CTF, real and reverse space

Image analysis
Microscopic imaging of colloidal particles and liquid crystalline phases.


Room temperature TEM
Imaging – CCD basics
Cryo-TEM preparation
Cryo-TEM imaging


Technion – Israel Institute of Technology:
  Course Title:                      ''Electron Microscopy of Soft Materials''
Lecturer: Prof. Ishi Talmon \ Chemical Engineering
Syllabus: The course provides the theoretical background for electron microscopy of liquid and semi-liquid material systems, namely, complex liquids. The course describes the operational principles the transmission- and scanning electron microscopes (TEM and SEM), their components, including electron guns, electromagnetic lenses, and detectors. The principles of image formation and electron diffraction in the TEM, and picture formation in the SEM are explained. Also described are the interactions between the electron beam and the specimen. The course emphasizes cryogenic-temperature electron microscopy methodologies, including specimen preparation, and imaging low-image-contrast, high-beam-sensitivity systems. Two laboratory-demonstrations are given in addition to the lectures.
After completing the course the student should have good understanding of electron microscopy of soft materials, its advantages, possible applications, and limitations.
Remarks: The course is given on fall semesters.
  Course Title:                      ''Analytical Scanning Electron Microscopy''
Lecturer: Dr. Alex Berner \ Materials Science & Engineering<
Webpage: weblink
Remarks: The course is given on fall semesters.
  Course Title:                      ''Transmission Electron Microscopy in Materials Science''
Lecturer: Dr. Yaron Kauffmann \ Materials Science & Engineering
Syllabus: Transmission electron microscopy (TEM) is becoming more and more essential in many fields of research involving nano-scale structures. The goal of this course is to provide the student with a basis upon which s/he can interpret electron microscopy results, understand the microscopy of others, and to know when (and when not) to turn to electron microscopy for answers concerning the microstructure of materials. This course attempts to cover the basic topics required in all current microscopy techniques in use, and to delve into some of the more advanced techniques which are used in Materials Science.
Webpage: weblink
Remarks: The course is given on spring semesters.
Tel-Aviv University:
  Course Title:                      ''Scanning Electron Microscopy''
Lecturer: Dr. Zahava Barkay \ Wolfson Applied Materials Research Centre
Syllabus: Background to scanning electron microscopy (SEM). Electron-specimen interaction: models for elastic and inelastic interaction. Monte-Carlo simulation for electron-specimen interaction. Properties of main signals and X-ray microanalysis. Electron optics: electron sources, magnetic lenses and aberrations. Principles of image formation. Various SEM types including ESEM and advanced methods. Practical SEM aspects and various applications.
Remarks: The course is given on fall semesters.

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