Date(s) - 11.10.2016 - 12.10.2016
CISCEM 2016, the 3rd International Conference on In-Situ and Correlative Electron Microscopy, aims to bring together an interdisciplinary group of scientists from the fields of biology, materials science,
geology, chemistry, and physics, to discuss future directions of in-situ electron microscopy research. Topics will include nanoscale studies of biological samples, and functional materials under
realistic or near realistic conditions, for example, in gaseous environments, at elevated temperatures, and in liquid.
The conference will take place at Aula (Assembly Hall) of Saarland University, Saarbruecken,
Germany. Registration deadline: 31 August 2016. Abstract submission deadline: 1 July 2016
For more information link to: http://ciscem2016.de