Symposium CM1 at the Spring MRS2016 intends to bring together researchers from different scientific fields discussing their needs for better resolved, faster and more controlled experimental materials studies to be conducted in aberration corrected (scanning) transmission electron microscopes.
The symposium will include imaging, spectroscopy and diffraction based applications to materials science problems with planar and focused illumination.
For call for abstracts click here. Submit your abstracts at http://www.mrs.org/spring2016/ before the deadline of 15 October 2015.
