New Frontiers in Aberration Corrected TEM


28.03.2016 - 01.04.2016    
All Day

Event Type

ISM2015 calendar


Symposium CM1 at the Spring MRS2016 intends to bring together researchers from different scientific fields discussing their needs for better resolved, faster and more controlled experimental materials studies to be conducted in aberration corrected (scanning) transmission electron microscopes.
The symposium will include imaging, spectroscopy and diffraction based applications to materials science problems with planar and focused illumination.
For call for abstracts click here. Submit your abstracts at before the deadline of 15 October 2015.

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