{"id":2346,"date":"2016-04-04T21:34:47","date_gmt":"2016-04-04T18:34:47","guid":{"rendered":"http:\/\/www.ismicroscopy.org.il\/ism2016\/?page_id=2346"},"modified":"2016-04-07T00:21:08","modified_gmt":"2016-04-06T21:21:08","slug":"fei-award","status":"publish","type":"page","link":"http:\/\/www.ismicroscopy.org.il\/ism2016\/fei-award\/","title":{"rendered":"FEI Award"},"content":{"rendered":"
\n\n\n\n
The FEI Company Award:<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

\"FEI<\/a><\/p>\n

 Deadline for award application: May 3, 2016 <\/span><\/div>\n

<\/br>
\nThe FEI Company Award<\/strong> is open to electron microscopists working in the materials science or life sciences<\/strong>, and will provide an international air ticket for the recipient to present a paper at an international scientific conference and\/or to visit overseas scientific laboratories within twelve months of the award.<\/p>\n

The award will be judged on the basis of a piece of original research in materials science or life sciences involving electron microscopy. The work must have been carried out in Israel. Applicants should register to the ISM2016 jubilee meeting.<\/p>\n

Candidates are invited to submit applications, or be nominated. Preference will be given to early to mid-career researchers.<\/p>\n

The application should contain:<\/p>\n