| Record Info |
instrumentation
Microscopes, Sample preparation, Analysis tools, Special detectors
- Instrument Type
- SEM
- Instrument Name
- Zeiss Ultra-Plus FEG-SEM
- Manufacturer
- Zeiss
- Special Detectors
- Instrument Photo
- Instrument Description
A Schottky field emmission gun SEM (FEG-SEM) which includes a heating stage up to 1050oC, a 80mm2 active area Oxford SDD EDS detector with an energy resolution of 127eV and a unique combination of detectors:
- Everhart Thornley chamber secondary electrons detector.
- In-lens secondary electrons detector.
- In-lens energy selected back scattered detector.
- Four-quadrant angular selected back scattered detector allowing imaging in orientation, topographic or composition modes.
- Transmission electron detector for STEM operations allowing bright and dark field imaging modes.
Lab Details
Details of the the labs and how to contact them
- Lab name
- MIKA
- Lab details
- Electron Microscopy Center located at the Department of Materials Engineering at the Technion
- Lab institute
- 4
- Lab location
- Department of Materials SCience & Engineering
- Lab URL
- mtrmika.technion.ac.il/
Contact details
- Contact person
- Dr. Alex Berner
- Contact email
- berner AT tx.technion.ac.il
- Contact phone
- 04-8294568, 5795
- Contact mobile
- Contact fax