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Record Info



Microscopes, Sample preparation, Analysis tools, Special detectors

Instrument Name
Zeiss Ultra-Plus FEG-SEM
Special Detectors
Instrument Photo
Instrument Description

A Schottky field emmission gun SEM (FEG-SEM) which includes a heating stage up to 1050oC, a 80mm2 active area Oxford SDD EDS detector with an energy resolution of 127eV and a unique combination of detectors:

  • Everhart Thornley chamber secondary electrons detector.
  • In-lens secondary electrons detector.
  • In-lens energy selected back scattered detector.
  • Four-quadrant angular selected back scattered detector allowing imaging in orientation, topographic or composition modes.
  • Transmission electron detector for STEM operations allowing bright and dark field imaging modes.

Lab Details

Details of the the labs and how to contact them

Lab name
Lab details
Electron Microscopy Center located at the Department of Materials Engineering at the Technion
Lab location
Department of Materials SCience & Engineering

Contact details

Contact person
Dr. Alex Berner
Contact email
berner AT tx.technion.ac.il
Contact phone
04-8294568, 5795
Contact mobile
Contact fax