PDB single

Record Info

 

Participant Info

Participant details

instrumentation

Microscopes, Sample preparation, Analysis tools, Special detectors

Instrument Name
Titan 80-300 S/TEM
Manufacturer
FEI
Special Detectors
EDS (EDAX), GIF (Gatan EELS detector - Tridiem), HAADF-STEM (Fischione), BF-DF STEM (Gatan)
Instrument Photo
Instrument Description

The Titan 80-300 FEG-S/TEM (FEI) is an all-new platform dedicated to correction and monochromator technology. The Titan S/TEM system is the world’s highest resolution commercially-available microscope, yielding powerful sub-Angstrom (atomic scale) imaging and analysis.

Titan’s dedicated platform for corrector and monochromator technologies and their applications is designed for a high degree of automation and provides ultimate stability, performance and flexibility.

The microscope transfers information deep into sub-Angstrom resolution making way for the highest performance available in both transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) modes, enabling extraordinary new scientific opportunities for direct observation aimed at enabling analysis of individual nanostructures at an unprecedented resolution of 0.7 Angstrom, which is approximately one-third the size of a carbon atom.

The microscope was purchased as part of the Russell Berrie Nanotechnology Institute .

Lab Details

Details of the the labs and how to contact them

Lab name
MIKA
Lab details
Electron Microscopy Center located at the Department of Materials Engineering at the Technion
Lab location
Department of Materials SCience & Engineering

Contact details

Contact person
Dr. Yaron Kauffmann
Contact email
mtyaron AT tx.technion.ac.il
Contact phone
04-8294567, 5795
Contact mobile
Contact fax