Microscopes, Sample preparation, Analysis tools, Special detectors
- Instrument Type
- Instrument Name
- Titan 80-300 S/TEM
- Special Detectors
- EDS (EDAX), GIF (Gatan EELS detector - Tridiem), HAADF-STEM (Fischione), BF-DF STEM (Gatan)
- Instrument Description
The Titan 80-300 FEG-S/TEM (FEI) is an all-new platform dedicated to correction and monochromator technology. The Titan S/TEM system is the world’s highest resolution commercially-available microscope, yielding powerful sub-Angstrom (atomic scale) imaging and analysis.
Titan’s dedicated platform for corrector and monochromator technologies and their applications is designed for a high degree of automation and provides ultimate stability, performance and flexibility.
The microscope transfers information deep into sub-Angstrom resolution making way for the highest performance available in both transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) modes, enabling extraordinary new scientific opportunities for direct observation aimed at enabling analysis of individual nanostructures at an unprecedented resolution of 0.7 Angstrom, which is approximately one-third the size of a carbon atom.
The microscope was purchased as part of the Russell Berrie Nanotechnology Institute .
Details of the the labs and how to contact them
- Lab name
- Lab details
- Electron Microscopy Center located at the Department of Materials Engineering at the Technion
- Lab institute
- Lab location
- Department of Materials SCience & Engineering
- Contact person
- Dr. Yaron Kauffmann
- Contact email
- mtyaron AT tx.technion.ac.il
- Contact phone
- 04-8294567, 5795
- Contact mobile
- Contact fax