{"id":130,"date":"2025-11-24T15:38:31","date_gmt":"2025-11-24T15:38:31","guid":{"rendered":"https:\/\/www.ismicroscopy.org.il\/ism2026\/?page_id=130"},"modified":"2026-05-12T08:49:47","modified_gmt":"2026-05-12T08:49:47","slug":"workshop-program","status":"publish","type":"page","link":"https:\/\/www.ismicroscopy.org.il\/ism2026\/workshop-program\/","title":{"rendered":"Workshop Program"},"content":{"rendered":"<div style=\"text-align: center;\">Tutorial Workshop:<\/br><\/br><span style=\"font-weight:bold; font-size:22px; color: black;\">Analytical Electron Microscopy<\/span><\/br><\/br><strong>Technion &#8211; Israel Institute of Technology, Haifa<\/strong><\/br><br \/>\n<i class=\"fa fa-map-marker fa-2x\" aria-hidden=\"true\"><\/i>&nbsp;&nbsp;<strong>Department of Materials Science &#038; Engineering, David Wang Auditorium, Dalia Maydan Bldg. 3rd floor<\/strong><\/div>\n<div style=\"text-align: center; margin-left: 15%; margin-right: 15%;\">\n<time datetime=\"2026-05-13\" class=\"icon\"><year>2026<\/year><month>May<\/month><day>13<\/day><\/time><\/div>\n<p><!-- \n\n<div style=\"color:red; text-align: justify; margin-left: 15%; margin-right: 15%;\"><i class=\"fa fa-exclamation-circle fa-2x\" aria-hidden=\"true\"><\/i>&nbsp;&nbsp;<b>Due to over-registration for the tomography track, some applicants will be rejected by e-mail message personally addressed to them. If room allows, the option to attend the SPA track will be offered instead.<\/b><\/div>\n\n<\/br> --><\/p>\n<div style=\"color:red; text-align: center; margin-left: 15%; margin-right: 15%;\"><i class=\"fa fa-exclamation-circle fa-2x\" aria-hidden=\"true\"><\/i>&nbsp;&nbsp;<b>Due to over-registration for the demos, all 4 demo sessions will be presented in the two time slots.<\/br>Registration for the demo sessions is closed.<\/b><\/div>\n<p><\/br><\/p>\n<p><!-- \n\n<div style=\"text-align: center;\"><strong>For participation in the workshop please register on the following link : <\/strong>[button size=\"5\" icon=\"icon: pencil-square-o\" url=\"https:\/\/tinyurl.com\/2t4db3ns\" target=\"blank\" style=\"default\"] Workshop Registration [\/button]<\/div>\n\n --><br \/>\n<\/br><\/p>\n<table style=\"width: 100%; border-width: 0px; border-bottom: 2px solid #D2421B;\">\n<tr>\n<td style=\"padding:2px 0px; font-weight: bold; font-size: 18px; color:#D2421B;\">Organizing Committee :<\/td>\n<\/tr>\n<\/table>\n<p><strong>Olga Kleinerman<\/strong> &#8211; Technion<\/p>\n<p><strong>Yaron Kauffmann<\/strong> &#8211; Technion<\/p>\n<table style=\"width: 100%; border-top: 0px solid black; border-bottom: 2px solid #D2421B; \">\n<tbody>\n<tr>\n<td style=\"vertical-align: bottom; padding: 2px 0px; font-weight: bold; font-size: 18px; color: #d2421b;\" width=\"70%\">Workshop Program :<span style=\"font-weight: bold; font-size: 14px; color:black;\"><\/span><\/td>\n<td style=\"padding: 2px 0px; font-weight: bold; font-size: 18px;\" align=\"right\" width=\"30%\"><a href=\"http:\/\/www.ismicroscopy.org.il\/ism2026\/files\/2026\/05\/ISM2026-Pre-meeting-Workshop-Program-FINAL.pdf\"><img loading=\"lazy\" decoding=\"async\"  src=\"http:\/\/www.ismicroscopy.org.il\/ism2015\/files\/2014\/12\/print-icon.png\" alt=\"print ISM2026 workshop program\" width=\"50\" height=\"50\" style=\"vertical-align: bottom;\" data-id=\"1616\" \/><\/a> <\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n\n<table id=\"tablepress-15\" class=\"tablepress tablepress-id-15 tbody-has-connected-cells\">\n<tbody>\n<tr class=\"row-1\">\n\t<td class=\"column-1\">09:30 - 09:50<\/td><td colspan=\"4\" class=\"column-2\"><b>Get together &amp; Coffee <i class=\"fas fa-coffee\">&nbsp;&nbsp;<\/i><\/b><\/td>\n<\/tr>\n<tr class=\"row-2\">\n\t<td class=\"column-1\">09:50 - 10:00<\/td><td colspan=\"4\" class=\"column-2\"><b>Welcome and Introduction - Prof. Eugen Rabkin<\/b>, Dean of the Department of Materials Science &amp; Engineering<\/td>\n<\/tr>\n<tr class=\"row-3\">\n\t<td colspan=\"5\" class=\"column-1\">MORNING SESSION<\/td>\n<\/tr>\n<tr class=\"row-4\">\n\t<td class=\"column-1\">Session Chair:<\/td><td colspan=\"4\" class=\"column-2\"><b>Tamar Segal-Peretz<\/b>, Technion<\/td>\n<\/tr>\n<tr class=\"row-5\">\n\t<td class=\"column-1\">10:00 - 10:35<\/td><td colspan=\"4\" class=\"column-2\"><b>Wayne D. Kaplan <\/b>,  Technion<\/br><span style=\"color: #da433f; font-weight:bold; font-style:italic;\"><a href=\"#L1\">ANALYTICAL ELECTRON MICROSCOPY FOR MATERIALS SCIENCE: GOING BEYOND COMPOSITION ALONE<br \/>\n<\/a><\/span><\/td>\n<\/tr>\n<tr class=\"row-6\">\n\t<td class=\"column-1\">10:35 - 11:10<\/td><td colspan=\"4\" class=\"column-2\"><b>Alex Berner<\/b>,  Technion<\/br><span style=\"color: #da433f; font-weight:bold; font-style:italic;\"><a href=\"#L2\">STATISTICAL ASPECTS IN ANALYTICAL ELECTRON MICROSCOPY<\/a><\/span><\/td>\n<\/tr>\n<tr class=\"row-7\">\n\t<td class=\"column-1\">11:10 - 11:25<\/td><td colspan=\"4\" class=\"column-2\"><b><i class=\"fas fa-coffee\">&nbsp;&nbsp;<\/i><i>Coffee Break<\/i><\/b><\/td>\n<\/tr>\n<tr class=\"row-8\">\n\t<td class=\"column-1\">Session Chair:<\/td><td colspan=\"4\" class=\"column-2\"><b>Alexander Upcher<\/b>, Ben-Gurion University<\/td>\n<\/tr>\n<tr class=\"row-9\">\n\t<td class=\"column-1\">11:25 - 12:00<\/td><td colspan=\"4\" class=\"column-2\"><b>Lothar Houben<\/b>,  Weizmann Institute<\/br><span style=\"color: #da433f; font-weight:bold; font-style:italic;\"><a href=\"#L3\">EELS IN THE TEM: FUNDAMENTALS, MODERN TOOLS AND APPLICATIONS BEYOND ELEMENTAL ANALYSIS<\/a><\/span><\/td>\n<\/tr>\n<tr class=\"row-10\">\n\t<td class=\"column-1\">12:00 - 12:30<\/td><td colspan=\"4\" class=\"column-2\"><b>Yaron Amouyal<\/b>,  Technion<\/br><span style=\"color: #da433f; font-weight:bold; font-style:italic;\"><a href=\"#L4\">ATOM PROBE TOMOGRAPHY FOR ELEMENTAL ANALYSIS<\/a><\/span><\/td>\n<\/tr>\n<tr class=\"row-11\">\n\t<td class=\"column-1\">12:30 - 13:10<\/td><td colspan=\"4\" class=\"column-2\"><b><i>Lunch Break &amp; Lab Tour<\/i><\/b><\/td>\n<\/tr>\n<tr class=\"row-12\">\n\t<td class=\"column-1\">Session Chair:<\/td><td colspan=\"4\" class=\"column-2\"><b>Zipora Lansky<\/b>, Technion<\/td>\n<\/tr>\n<tr class=\"row-13\">\n\t<td class=\"column-1\">11:25 - 12:00<\/td><td colspan=\"4\" class=\"column-2\"><b>Zahava Barkay<\/b>,  Tel-Aviv University<\/br><span style=\"color: #da433f; font-weight:bold; font-style:italic;\"><a href=\"#L5\">CATHODOLUMINESCENCE IN SEM - RESEARCH AND APPLICATION<\/a><\/span><\/td>\n<\/tr>\n<tr class=\"row-14\">\n\t<td colspan=\"5\" class=\"column-1\">DEMOS at The Electron Microscopy Center - MIKA<\/td>\n<\/tr>\n<tr class=\"row-15\">\n\t<td class=\"column-1\">14:00 - 14:45<\/td><td class=\"column-2\"><b>Olga Kleinerman<\/b>,  Technion<\/br><span style=\"color: #da433f; font-weight:bold; font-style:italic;\"><a href=\"\">LOW ENERGIES SEM-EDS<\/a><\/span><\/td><td class=\"column-3\"><b>Yaron Kauffmann <\/b>,  Technion<\/br><span style=\"color: #da433f; font-weight:bold; font-style:italic;\"><a href=\"\">STEM EELS &amp;EDS<\/a><\/span><\/td><td class=\"column-4\"><b>Maria Koifman-Khristosov<\/b>,  Technion<\/br><span style=\"color: #da433f; font-weight:bold; font-style:italic;\"><a href=\"\">SEM-WDS<\/a><\/span><\/td><td class=\"column-5\"><b>Inbar Freilich<\/b>,  Technion<\/br><span style=\"color: #da433f; font-weight:bold; font-style:italic;\"><a href=\"\">ATOM PROBE TOMOGRAPHY (APT)<\/a><\/span><\/td>\n<\/tr>\n<tr class=\"row-16\">\n\t<td class=\"column-1\">14:45 - 15:00<\/td><td colspan=\"4\" class=\"column-2\"><b><i class=\"fas fa-coffee\">&nbsp;&nbsp;<\/i><i>Coffee Break<\/i><\/b><\/td>\n<\/tr>\n<tr class=\"row-17\">\n\t<td class=\"column-1\">15:00 - 15:45<\/td><td class=\"column-2\"><b>Olga Kleinerman<\/b>,  Technion<\/br><span style=\"color: #da433f; font-weight:bold; font-style:italic;\"><a href=\"\">LOW ENERGIES SEM-EDS<\/a><\/span><\/td><td class=\"column-3\"><b>Yaron Kauffmann <\/b>,  Technion<\/br><span style=\"color: #da433f; font-weight:bold; font-style:italic;\"><a href=\"\">STEM EELS &amp;EDS<\/a><\/span><\/td><td class=\"column-4\"><b>Maria Koifman-Khristosov<\/b>,  Technion<\/br><span style=\"color: #da433f; font-weight:bold; font-style:italic;\"><a href=\"\">SEM-WDS<\/a><\/span><\/td><td class=\"column-5\"><b>Inbar Freilich<\/b>,  Technion<\/br><span style=\"color: #da433f; font-weight:bold; font-style:italic;\"><a href=\"\">ATOM PROBE TOMOGRAPHY (APT)<\/a><\/span><\/td>\n<\/tr>\n<tr class=\"row-18\">\n\t<td class=\"column-1\">15:45<\/td><td colspan=\"4\" class=\"column-2\"><b><i>Departure<\/i><\/b><\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<!-- #tablepress-15 from cache -->\n<p><\/br><\/p>\n<table style=\"width: 100%; border-width: 0px; border-bottom: 2px solid #D2421B;\">\n<tr>\n<td style=\"padding:2px 0px; font-weight: bold; font-size: 18px; color:#D2421B;\">Getting there:<\/td>\n<\/tr>\n<\/table>\n<div class=\"su-row\"><div class=\"su-column su-column-size-2-3\"><div class=\"su-column-inner su-u-clearfix su-u-trim\"><div class=\"su-gmap su-u-responsive-media-yes\"><iframe loading=\"lazy\" width=\"800\" height=\"400\" src=\"\/\/maps.google.com\/maps?q=Materials%20Engineering%2C%20Haifa%2C%20Israel&amp;output=embed\" title=\"\"><\/iframe><\/div><\/div><\/div>\n<div class=\"su-column su-column-size-1-3\"><div class=\"su-column-inner su-u-clearfix su-u-trim\">\n<p style=\"font-size:16px; font-weight:bold;\">Address:<\/br>Department of Materials Science and Engineering, Technion , Haifa.<\/p>\n<p>Link to Waze &#8211; <a href=\"https:\/\/waze.com\/ul\/hsvbfmn88y\" target=\"_blank\" rel=\"noopener noreferrer\"><img loading=\"lazy\" decoding=\"async\" data-id=\"1273\"  src=\"http:\/\/www.ismicroscopy.org.il\/ism2016\/files\/2015\/11\/wazeIcon-150x150.png\" alt=\"wazeIcon\" width=\"50\" height=\"50\" align=\"middle\" class=\"size-thumbnail wp-image-1273\" \/><\/a><\/br>Link to GoogleMaps &#8211; <a href=\"https:\/\/goo.gl\/maps\/UWNPhzZRKyEompAU8\" target=\"_blank\" rel=\"noopener noreferrer\"><img loading=\"lazy\" decoding=\"async\" data-id=\"1282\"  src=\"http:\/\/www.ismicroscopy.org.il\/ism2016\/files\/2015\/11\/googlemaps_icon-150x150.png\" alt=\"googlemaps_icon\" width=\"40\" height=\"40\" align=\"middle\" class=\"size-thumbnail wp-image-1282\" \/><\/a><\/br><br \/>\n<strong><u>Getting here by bus<\/u><\/strong>:<\/p>\n<li>From Hof HaCarmel central bus station and Hof HaCarmel train station take bus #1 or #11.<\/li>\n<li>From Haifa Merkaz \u2013 Hashmona train station take bus #17.<\/li>\n<p><\/br>Get off at the 3rd bus stop after the main gate of the Technion. Cross the road and head to the first building \u2013 De-Jour building.<br \/>\n<\/br><strong><u>Getting here by cable car<\/u><\/strong>:<\/p>\n<li>Get off at Lev HaMifratz train station.<\/li>\n<li>Walk to Merkazit Mifratz Rachbalit station (5 minutes walk).<\/li>\n<p><\/br>Get off at the Technion 1st station. Cross the road and head to the first building \u2013 De-Jour building.<br \/>\n<\/div><\/div><\/div>\n<p><\/br><\/p>\n<div style=\"text-align: justify; line-height: 1.5;\">\n<table style=\"width: 100%; border-width: 0px; border-bottom: 2px solid #D2421B;\">\n<tr>\n<td style=\"padding:2px 0px; font-weight: bold; font-size: 18px; color:#D2421B;\">Abstracts:<\/td>\n<\/tr>\n<\/table>\n<p><a name=\"L1\"><\/a><\/p>\n<table style=\"width: 100%; border-width: 0px; border-bottom: 2px solid #D2421B;\">\n<tr>\n<td style=\"padding:2px 0px; font-weight: bold; font-size: 14px; color:blue;\">Lecture 1: ANALYTICAL ELECTRON MICROSCOPY FOR MATERIALS SCIENCE: GOING BEYOND COMPOSITION ALONE (Wayne D. Kaplan \/ Department of Materials Science and Engineering, Technion)<\/td>\n<\/tr>\n<\/table>\n<p>Analytical electron microscopy includes a powerful set of techniques for determining qualitative and quantitative chemical information within the electron microscope. In the scanning electron microscope (SEM), these techniques include energy dispersive X-ray spectroscopy (EDS) and wavelength dispersive spectroscopy (WDS). In the scanning\/transmission electron microscope (S\/TEM), analytical methods include EDS from thin foils and electron energy loss spectroscopy (EELS).<\/p>\n<p>Yet analytical electron microscopy offers much more than simply identifying which elements are present and measuring their local concentrations. Increasingly, these methods are being used to reveal deeper material insights, including valence states, local electronic structure, and Gibbsian excess at free surfaces, interfaces and grain boundaries.<\/p>\n<p>This tutorial will provide an accessible overview of what can be achieved using EDS and WDS in both the SEM and S\/TEM, with an emphasis on practical approaches for obtaining results that are as quantitative, reliable, and straightforward as possible. The goal is to highlight not only the capabilities of these methods, but also how they can be used to answer important materials science questions that go well beyond composition alone.<\/p>\n<p><\/br><\/p>\n<p><a name=\"L2\"><\/a><\/p>\n<table style=\"width: 100%; border-width: 0px; border-bottom: 2px solid #D2421B;\">\n<tr>\n<td style=\"padding:2px 0px; font-weight: bold; font-size: 14px; color:blue;\">Lecture 2: STATISTICAL ASPECTS IN ANALYTICAL ELECTRON MICROSCOPY (Alex Berner \/ Department of Materials Science and Engineering, Technion)<\/td>\n<\/tr>\n<\/table>\n<p>Repeatability of X-ray intensity measurements will be considered based on Poisson statistics.  Formulas for estimation and prediction of limit of element detection for EDS\/WDS\/SEM and EDS\/TEM will be derived.  Optimal analytical conditions for the minimization of detection limits will be found.  Quantitative determination of a degree of compositional non-uniformity in solid solutions will be considered.<br \/>\n<\/br><\/p>\n<p><a name=\"L3\"><\/a><\/p>\n<table style=\"width: 100%; border-width: 0px; border-bottom: 2px solid #D2421B;\">\n<tr>\n<td style=\"padding:2px 0px; font-weight: bold; font-size: 14px; color:blue;\">Lecture 3: EELS IN THE TEM: FUNDAMENTALS, MODERN TOOLS AND APPLICATIONS BEYOND ELEMENTAL ANALYSIS (Lothar Houben \/ Weizmann Institute of Science)<\/td>\n<\/tr>\n<\/table>\n<p>Electron energy-loss spectroscopy (EELS) in the transmission electron microscope (TEM) provides rich insight into the composition and electronic structure of materials. This contribution introduces the fundamental principles of EELS and highlights how recent advances in instrumentation expand its capabilities. In particular, direct electron detection enables enhanced sensitivity and improved signal-to-noise, allowing reliable low-dose measurements for beam-sensitive systems. Application examples include monochromated EELS for probing optical excitations and fast, low-dose core-loss EELS for accessing bonding and electronic structure. Together, these approaches demonstrate how modern EELS enables the study of materials properties well beyond elemental analysis.<\/p>\n<p><\/br><\/p>\n<p><a name=\"L4\"><\/a><\/p>\n<table style=\"width: 100%; border-width: 0px; border-bottom: 2px solid #D2421B;\">\n<tr>\n<td style=\"padding:2px 0px; font-weight: bold; font-size: 14px; color:blue;\">Lecture 4: ATOM PROBE TOMOGRAPHY FOR ELEMENTAL ANALYSIS (Yaron Amouyal \/ Department of Materials Science and Engineering, Technion)<\/td>\n<\/tr>\n<\/table>\n<p>Atom Probe Tomography (APT) is a powerful materials characterization technique that provides three\u2011dimensional imaging of sub\u2011micron samples with nearly atomic resolution and enables precise quantification of low\u2011concentration species (<100 at.\u202fppm) distributed across nanometer\u2011scale distances and embedded within complex spatial morphologies. When combined with electron microscopy, APT has become an exceptionally versatile tool for addressing fundamental questions in materials science, particularly in metallic, ceramic, and semiconducting systems, with some recent extension of its capabilities toward soft and molecular materials.<\/p>\n<p>We will briefly outline the physical principles of laser assisted, local electrode APT, with particular attention to the factors that govern the accuracy of elemental quantification. We will then introduce our new LEAP\u00ae\u202f6000\u202fXR system, which features a deep UV laser, an energy compensated electrostatic lens, and an optional synchronous laser plus voltage pulsing mode. Together, these advances substantially narrow spectral peak widths, enhance the signal to noise ratio, and reduce the incidence of multiple events. As a result, the system delivers markedly improved reliability in the measurement of low concentration species, enabling more robust and confident compositional analysis at the atomic scale.<\/p>\n<p>We view the establishment of the Israel Center for APT as an important milestone in advancing the field of materials characterization in Israel, and we warmly invite the research and industry communities to engage with the center and make full use of its capabilities and services.<\/p>\n<p><\/br><\/p>\n<p><a name=\"L5\"><\/a><\/p>\n<table style=\"width: 100%; border-width: 0px; border-bottom: 2px solid #D2421B;\">\n<tr>\n<td style=\"padding:2px 0px; font-weight: bold; font-size: 14px; color:blue;\">Lecture 5: CATHODOLUMINESCENCE IN SEM &#8211; RESEARCH AND APPLICATION (Zahava Barkay \/ Tel-Aviv University)<\/td>\n<\/tr>\n<\/table>\n<p>Cathodoluminescence (CL) in the scanning electron microscope (SEM) constitutes a powerful platform for nanoscale optical characterization. Conventionally, SEM-CL has been employed for wavelength-resolved spectroscopy, enabling the identification and analysis of impurities and defect states at parts-per-million (ppm) concentrations.<\/p>\n<p>Here, we report advanced CL methodologies, including hyperspectral imaging, nanoscale resonance mapping with spatial resolution approaching 10 nm, and angle-resolved emission measurements. We further demonstrate optical band structure characterization via energy\u2013momentum (E\u2013k) dispersion analysis, along with polarization-resolved and time-resolved second-order correlation (g\u00b2) measurements.<\/p>\n<p>The results presented here underscore our laboratory\u2019s capabilities in nanophotonics, with particular emphasis on recent studies of plasmonic nanostructures, photonic crystals, and electron-beam-driven light emission phenomena, including the Smith\u2013Purcell effect.<\/p>\n<p><\/br><\/p>\n<\/div>\n","protected":false},"excerpt":{"rendered":"<p>Tutorial Workshop:Analytical Electron MicroscopyTechnion &#8211; Israel Institute of Technology, Haifa &nbsp;&nbsp;Department of Materials Science &#038; Engineering, David Wang Auditorium, Dalia Maydan Bldg. 3rd floor 2026May13 &nbsp;&nbsp;Due to over-registration for the demos, all 4 demo sessions will be presented in the two time slots.Registration for the demo sessions is closed. Organizing\u2026<\/p>\n<p class=\"continue-reading-button\"> <a class=\"continue-reading-link\" href=\"https:\/\/www.ismicroscopy.org.il\/ism2026\/workshop-program\/\">Continue reading<i class=\"crycon-right-dir\"><\/i><\/a><\/p>\n","protected":false},"author":2,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"folder":[],"class_list":["post-130","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/www.ismicroscopy.org.il\/ism2026\/wp-json\/wp\/v2\/pages\/130","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.ismicroscopy.org.il\/ism2026\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.ismicroscopy.org.il\/ism2026\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.ismicroscopy.org.il\/ism2026\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.ismicroscopy.org.il\/ism2026\/wp-json\/wp\/v2\/comments?post=130"}],"version-history":[{"count":42,"href":"https:\/\/www.ismicroscopy.org.il\/ism2026\/wp-json\/wp\/v2\/pages\/130\/revisions"}],"predecessor-version":[{"id":697,"href":"https:\/\/www.ismicroscopy.org.il\/ism2026\/wp-json\/wp\/v2\/pages\/130\/revisions\/697"}],"wp:attachment":[{"href":"https:\/\/www.ismicroscopy.org.il\/ism2026\/wp-json\/wp\/v2\/media?parent=130"}],"wp:term":[{"taxonomy":"folder","embeddable":true,"href":"https:\/\/www.ismicroscopy.org.il\/ism2026\/wp-json\/wp\/v2\/folder?post=130"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}