PDB single

Record Info

 

Participant Info

Participant details

instrumentation

Microscopes, Sample preparation, Analysis tools, Special detectors

Instrument Name
Tecnai T20
Manufacturer
FEI
Special Detectors
EDS (Edax), Gatan BF-DF STEM
Instrument Photo
Instrument Description

A 200KeV (or 120KeV) TEM with a LaB6 electron source and an FEI Supertwin Objective Lens. This microscope is also equipped with a BF and DF STEM detectors, an EDS detector, a plate camera and a 1Kx1K Gatan 694 retractable slow scan CCD.

Lab Details

Details of the the labs and how to contact them

Lab name
MIKA
Lab details
Electron Microscopy Center located at the Department of Materials Engineering at the Technion
Lab location
Department of Materials SCience & Engineering

Contact details

Contact person
Dr. Yaron Kauffmann
Contact email
mtyaron AT tx.technion.ac.il
Contact phone
04-8294567, 5795
Contact mobile
Contact fax