| Record Info |
instrumentation
Microscopes, Sample preparation, Analysis tools, Special detectors
- Instrument Type
- 6
- Instrument Name
- BAF 60 Freeze fracture device
- Manufacturer
- Bal-Tec / Leica Microsystems
- Special Detectors
- Instrument Photo
- Instrument Description
The BAF 60 freeze fracture device allows for the preparation of frozen aqueous samples for their observation in the cryo-SEM. Frozen samples are usually fractured in vacuum to expose inner surfaces and the sample is then transferred to observation in the cryo-SEM. Prior to its transfer, the sample can also be coated by metal and/or by carbon. It is possible to expose some components in the sample by controlled sublimation of water from the surface of the sample.The device can also be used for obtaining replicas of the sample surface, which is observed in the TEM.
Lab Details
Details of the the labs and how to contact them
- Lab name
- Electron Microscopy Unit
- Lab details
- Central EM facility
- Lab institute
- 5
- Lab location
- Old Wolfson Building / Department of Chemical Research Support
- Lab URL
- EM Unit Homepgae
Contact details
- Contact person
- Eyal Shimoni
- Contact email
- shimoni.eyal (at) gmail.com
- Contact phone
- Contact mobile
- Contact fax