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Record Info


Microscopes, Sample preparation, Analysis tools, Special detectors

Instrument Name
BAF 60 Freeze fracture device
Bal-Tec / Leica Microsystems
Special Detectors
Instrument Photo
Instrument Description

The BAF 60 freeze fracture device allows for the preparation of frozen aqueous samples for their observation in the cryo-SEM. Frozen samples are usually fractured in vacuum to expose inner surfaces and the sample is then transferred to observation in the cryo-SEM. Prior to its transfer, the sample can also be coated by metal and/or by carbon. It is possible to expose some components in the sample by controlled sublimation of water from the surface of the sample.The device can also be used for obtaining replicas of the sample surface, which is observed in the TEM.

Lab Details

Details of the the labs and how to contact them

Lab name
Electron Microscopy Unit
Lab details
Central EM facility
Lab location
Old Wolfson Building / Department of Chemical Research Support

Contact details

Contact person
Eyal Shimoni
Contact email
shimoni.eyal (at) gmail.com
Contact phone
Contact mobile
Contact fax


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